Semiconductor Heating

GRAND HOLD.
GRAND HOLD.
GRAND HOLD.
GRAND HOLD.
GRAND HOLD.

WAFER TESTING

Heating Challenges in Semiconductor Testing

Semiconductor and wafer testing are highly sensitive to temperature control. Complex carrier structures and uneven heat transfer often lead to localized temperature variations and thermal drift. These issues affect measurement stability and increase calibration costs.

Heating Design for Wafer Testing

Custom-designed for wafer test carriers and module fixtures, the heater can be tightly bonded to metal surfaces to ensure uniform heating across the entire structure. It also supports multi-zone power distribution, effectively reducing thermal drift and improving test stability.

Technical Highlights

Uniform Heating Design

Heat is spread uniformly across the heater, preventing temperature differences between the center and the sides.

Custom Power Design

Different power outputs can be configured on the heater to control temperature levels in designated zones.

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© Copyright – GRAND HOLD CORPORATION
design by Morcept

CONTACT INFO

© Copyright – GRAND HOLD CORPORATION
design by Morcept